FEI-XL30-FEG Environmental scanning electronic microscope and EDS analyzing system;
Dynamic mechanical analyzer;
Differential thermal analysis;
Low temperature mechanical testing machine;
Hydrogen storage performance analyzer;
Real-time two-dimensional X-ray observation device;
QM100MK111 Long focus microscopes;
DISP-8 Acoustic emission systems;
AG-XD Shimadzu slow tensile stress corrosion testing machines;
EHF-EA5-10L Corrosion fatigue testing equipments;
8 Electrochemical workstations;
Multimode IIID scanning probe microscope;
Scanning microelectrode system;
Roughness testing instrument;
Erosion-corrosion pipeline system;
Cavitation vibration testing machine;
High speed dial instrument;
Jet erosion-corrosion testing device;
CFD computer workstation with FAC and FIV simulation system;
Magnetron sputtering and ion complex coating machine;
Resistance coating machine, etc. |
LEAP 5000 series three-dimensional atomic probe
Environmental scanning electronic microscope
