ICDD awarded for significant contribution of new XRD patterns
2010-03-09
The International Center for Diffraction Data (ICDD) awarded Prof. Yanchun Zhou and his student Lingfeng He in recognition of the significant contribution of 3 XRD patterns to the Powder Diffraction File-Release 2009 (Hf3Al3C5 59-310, Hf3Al4C6 59-311, Hf2Al4C5 59-312).
