The recipient of 2016 Lee Hsun Lecture Series—Lee Hsun Research Award, Prof. Gianluigi A. Botton from McMaster University, visited Institute of Metal Research, Chinese Academy of Sciences (IMR, CAS) from June 12 to 15, 2017.

During the visit, Prof. Botton delivered a lecture entitled “Probing the Structure of Nanoscale Materials with Electron Energy Loss Spectroscopy in the Transmission Electron Microscope”. He presented various examples of applications of electron microscopy and test cases where monolayer segregation was observed and confirmed from Electron energy loss spectroscopy.

Prof. Botton is the Canada Research Chair in Electron Microscopy of Nanoscale Materials, McMaster University, Canada. He is dedicated in the examination of the composition, structure and bonding of nanostructured materials using advanced microscopy and spectroscopy.

Prof. Botton has developed numerous advanced techniques for using electron microscopes that provide very high spatial resolution information, including transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). Using TEM and EELS technology, he has made it possible to detect signals from few atomic layers at interfaces and nanostructures, develop models to describe the analytical data in terms of structure and bonding changes, and describe the relationships between the observations and the properties of the materials.

Prof. ZHANG Zhefeng, the Deputy Director of IMR presents the plaque of Lee Hsun Lecture Series to Prof. Gianluigi A. Botton.(Image by IMR)

Prof. Gianluigi A. Botton delivers a lecture. (Image by IMR)