Details of the Publication | |||
Paper Code | 0022-0744 | ||
Title | Crack propagation of single crystal beta-Sn during in-situ TEM straining | ||
Authors | Shang P J, Liu Z Q, Li D X, Shang J K | ||
Corresponding Author | Liu Z Q | ||
Title of Journal | JOURNAL OF ELECTRON MICROSCOPY | ||
Year | 2010 | ||
Volume | 59 | ||
Number | 1 | ||
Page | 61 | ||
Abstract | |||
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Classification: | SCI | ||
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