Details of the Publication
Paper Code   0022-0744
Title   Crack propagation of single crystal beta-Sn during in-situ TEM straining
Authors   Shang P J, Liu Z Q, Li D X, Shang J K
Corresponding Author   Liu Z Q
Title of Journal   JOURNAL OF ELECTRON MICROSCOPY
Year   2010
Volume   59
Number   1
Page   61
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Classification: SCI
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